ic-SECM470 Intermittent Contact Scanning Electrochemical Microscopy

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ic-SECM470 Intermittent Contact Scanning Electrochemical Microscopy

SECM with the ability to distinguish topographical and electrochemical induced response

SECM is one of the fastest growing techniques used in scanning probe electrochemistry. Standard scanning electrochemical microscopy does not have the ability to distinguish differences in topographical induced changes and electrochemical induced changes and a simple way to maintain very close probe-sample proximity.

ic-SECM470 introduces a brand new technique to overcome these limitations by using an innovative tip positioning method that allows surface topography and activity to be resolved simultaneously and independently.
The intermittent contact technique allows an SECM probe to maintain the same degree of contact with the sample over the course of a scan.

Conventional SECM modulation and measurement of the probe and sample electrochemistry can be made whilst the intermittent contact control is in operation.



  • Investigation of soft biological materials
  • Monitoring the activity of biological cells
  • SECM studies on the soft surfaces of maize roots
  • Ion flux through semi permeable membranes



  • Simultaneous measurement of surface topography and electrochemistry
  • Assessing electrochemical microcell geometry
  • Investigations into the electric conductivity and surface topography of Boron doped diamond



  • Delaminated areas beneath organic coating
  • Plastic deformation and microstructures of Ti-6Al-4V
  • Corrosion of welded material
  • Localised corrosion of steel in oilfield formation waters

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ic-SECM470 Intermittent Contact Scanning Electrochemical Microscopy

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