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ic-SECM470 Intermittent Contact Scanning Electrochemical Microscopy
SECM with the ability to distinguish topographical and electrochemical induced response
SECM is one of the fastest growing techniques used in scanning probe electrochemistry. Standard scanning electrochemical microscopy does not have the ability to distinguish differences in topographical induced changes and electrochemical induced changes and a simple way to maintain very close probe-sample proximity.
ic-SECM470 introduces a brand new technique to overcome these limitations by using an innovative tip positioning method that allows surface topography and activity to be resolved simultaneously and independently.
Conventional SECM modulation and measurement of the probe and sample electrochemistry can be made whilst the intermittent contact control is in operation.
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