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INTERFEROMETER FOR THICKNESS MEASUREMENT
A white light interferometer measures the thickness of transparent materials and fims. It is based on the CHR controllers and can be combined with a CHR sensor head. Various infrared interferometers are available for measuring wafer thickness as well as glue and epoxy fims.
On each interface between different layers a part of the incident polychromatic light is reflected. A phase shift appears that varies with the wavelength. At certain wavelengths constructive interference occurs, at other wavelengths interference is destructive. The optical path length can be calculated from the intensity of the interference signal as a function of the wave number.
MODEL | RESOLUTION | MEASUREMENT RANGE | WORKING DISTANCE | SPOT SIZE |
INT-180 (WL) | 0.01 µm | 3 µm - 180 µm | 9.5 mm |
10 µm |
IT-500 (IR) | 0.14 µm | 37 µm - 4700 µm | 39.7 mm |
13 µm |
IT-500 RW (IR) | 0.17 µm | 45 µm - 5600 µm | 39.7 mm |
13 µm |
IT-1000 (IR) | 0.25 µm | 64 µm - 8200 µm | 39.7 mm |
13 µm |
IT-1000 RW (IR) | 0.22 µm | 57 µm - 7300 µm | 39.7 mm |
13 µm |
IT 18-3000 (IR) | 0.09 µm | 18 µm - 3000 µm | 39.7 mm |
13 µm |
IT 150-15000 | 0.45 µm | 150 µm - 15000 µm | 39.7 mm |
13 µm |
IT TW (IR) | 0.01 µm | 4 µm - 300 µm | 39.7 mm |
13 µm |
IT DW (IR) | 0.06 µm | 15 µm - 2000 µm | 39.7 mm |
13 µm |

Contact us for more details: info@snowhouse.ca